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| 題名: | Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy |
| 作者: | Liou, Y. H.;Pong, Way-faung;Tsai, M.-H.;Chang, K. H.;Hseih, H. H.;Chang, Y. K.;Chien, F. Z.;Tseng, P. K.;Lee, J. F.;Liou, Y.;Huang, J. C. A. |
| 貢獻者: | 淡江大學物理學系 |
| 關鍵詞: | chromium;cobalt;absorption;absorption spectroscopy;atom;chemical structure;structure analysis;thickness;X ray analysis |
| 日期: | 2000-10 |
| 上傳時間: | 2013-07-09 15:14:30 (UTC+8) |
| 出版者: | College Park: American Physical Society |
| 摘要: | We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11¯00) (40 Å)/Cr(211) (tCr) (tCr=2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results. |
| 關聯: | Physical Review B (Condensed Matter and Materials Physics) 62(14), pp.9616-9620 |
| DOI: | 10.1103/PhysRevB.62.9616 |
| 顯示於類別: | [物理學系暨研究所] 期刊論文
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