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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/19553


    Title: Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy
    Authors: Liou, Y. H.;Pong, Way-faung;Tsai, M.-H.;Chang, K. H.;Hseih, H. H.;Chang, Y. K.;Chien, F. Z.;Tseng, P. K.;Lee, J. F.;Liou, Y.;Huang, J. C. A.
    Contributors: 淡江大學物理學系
    Keywords: chromium;cobalt;absorption;absorption spectroscopy;atom;chemical structure;structure analysis;thickness;X ray analysis
    Date: 2000-10
    Issue Date: 2013-07-09 15:14:30 (UTC+8)
    Publisher: College Park: American Physical Society
    Abstract: We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11¯00) (40 Å)/Cr(211) (tCr) (tCr=2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results.
    Relation: Physical Review B (Condensed Matter and Materials Physics) 62(14), pp.9616-9620
    DOI: 10.1103/PhysRevB.62.9616
    Appears in Collections:[物理學系暨研究所] 期刊論文

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