X-Ray absorption studies of boron–carbon–nitrogen (BxCyNz) ternary alloys

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/19550

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题名:	X-Ray absorption studies of boron–carbon–nitrogen (BxCyNz) ternary alloys
作者:	Ray, S. C.;Tsai, H. M.;Chiou, J. W.;Jan, J. C.;Kumar, Krishna;Pong, W. F.;Chien, F. Z.;Tsai, M. H.;Chattopadhyay, S.;Chen, L. C.;Chien, S. C.;Lee, M. T.;Lin, S. T.;Chen, K. H.
贡献者:	淡江大學物理學系
关键词:	Boron–carbon–nitride;X-Ray absorption near-edge structure (XANES);Microstructure;Electronic properties
日期:	2004-04
上传时间:	2013-06-07 10:31:51 (UTC+8)
出版者:	Lausanne: Elsevier S. A.
摘要:	X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B N, B C, N C, and C N local bonding structures in BxCyNz, indicating that boron–carbon–nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.
關聯:	Diamond and Related Materials 13(4-8), pp.1553-1557
DOI:	10.1016/j.diamond.2003.11.052
显示于类别:	[物理學系暨研究所] 期刊論文

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