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請使用永久網址來引用或連結此文件:
https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/19550
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| 題名: | X-Ray absorption studies of boron–carbon–nitrogen (BxCyNz) ternary alloys |
| 作者: | Ray, S. C.;Tsai, H. M.;Chiou, J. W.;Jan, J. C.;Kumar, Krishna;Pong, W. F.;Chien, F. Z.;Tsai, M. H.;Chattopadhyay, S.;Chen, L. C.;Chien, S. C.;Lee, M. T.;Lin, S. T.;Chen, K. H. |
| 貢獻者: | 淡江大學物理學系 |
| 關鍵詞: | Boron–carbon–nitride;X-Ray absorption near-edge structure (XANES);Microstructure;Electronic properties |
| 日期: | 2004-04 |
| 上傳時間: | 2013-06-07 10:31:51 (UTC+8) |
| 出版者: | Lausanne: Elsevier S. A. |
| 摘要: | X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B N, B C, N C, and C N local bonding structures in BxCyNz, indicating that boron–carbon–nitride thin films have a ternary phase, rather than a mixture of segregated binary phases. |
| 關聯: | Diamond and Related Materials 13(4-8), pp.1553-1557 |
| DOI: | 10.1016/j.diamond.2003.11.052 |
| 顯示於類別: | [物理學系暨研究所] 期刊論文
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| 0925-9635_13(4n8)p1553-1557.pdf | | 122Kb | Adobe PDF | 329 | 檢視/開啟 |
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