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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/19550


    Title: X-Ray absorption studies of boron–carbon–nitrogen (BxCyNz) ternary alloys
    Authors: Ray, S. C.;Tsai, H. M.;Chiou, J. W.;Jan, J. C.;Kumar, Krishna;Pong, W. F.;Chien, F. Z.;Tsai, M. H.;Chattopadhyay, S.;Chen, L. C.;Chien, S. C.;Lee, M. T.;Lin, S. T.;Chen, K. H.
    Contributors: 淡江大學物理學系
    Keywords: Boron–carbon–nitride;X-Ray absorption near-edge structure (XANES);Microstructure;Electronic properties
    Date: 2004-04
    Issue Date: 2013-06-07 10:31:51 (UTC+8)
    Publisher: Lausanne: Elsevier S. A.
    Abstract: X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B N, B C, N C, and C N local bonding structures in BxCyNz, indicating that boron–carbon–nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.
    Relation: Diamond and Related Materials 13(4-8), pp.1553-1557
    DOI: 10.1016/j.diamond.2003.11.052
    Appears in Collections:[物理學系暨研究所] 期刊論文

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