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    題名: Replacing Batch Normalization with Memory-Based Affine Transformation for Test-Time Adaptation
    作者: Yeh, Jih Pin;Feng, Joe-Mei;Lin, Hwei Jen;Tokuyama, Yoshimasa
    日期: 2025-10-30
    上傳時間: 2026-04-16 12:05:17 (UTC+8)
    摘要: Batch normalization (BN) has become a foundational component in modern deep neural networks. However, one of its disadvantages is its reliance on batch statistics that may be unreliable or unavailable during inference, particularly under test-time domain shifts. While batch-statistics-free affine transformation methods alleviate this by learning per-sample scale and shift parameters, most treat samples independently, overlooking temporal or sequential correlations in streaming or episodic test-time settings. We propose LSTM-Affine, a memory-based normalization module that replaces BN with a recurrent parameter generator. By leveraging an LSTM, the module produces channel-wise affine parameters conditioned on both the current input and its historical context, enabling gradual adaptation to evolving feature distributions. Unlike conventional batch-statistics-free designs, LSTM-Affine captures dependencies across consecutive samples, improving stability and convergence in scenarios with gradual distribution shifts. Extensive experiments on few-shot learning and source-free domain adaptation benchmarks demonstrate that LSTM-Affine consistently outperforms BN and prior batch-statistics-free baselines, particularly when adaptation data are scarce or non-stationary.
    Keywords: batch normalization; affine transformation; LSTM; test-time adaptation; memory-based learning; domain adaptation; few-shot learning; normalization-free networks; deep neural networks; feature distribution shift
    關聯: Electronics 14(21) ,p. 4251
    DOI: 10.3390/electronics14214251
    顯示於類別:[資訊工程學系暨研究所] 期刊論文

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