English  |  正體中文  |  简体中文  |  Items with full text/Total items : 65231/98744 (66%)
Visitors : 31945577      Online Users : 2127
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/129191


    Title: Replacing Batch Normalization with Memory-Based Affine Transformation for Test-Time Adaptation
    Authors: Yeh, Jih Pin;Feng, Joe-Mei;Lin, Hwei Jen;Tokuyama, Yoshimasa
    Date: 2025-10-30
    Issue Date: 2026-04-16 12:05:17 (UTC+8)
    Abstract: Batch normalization (BN) has become a foundational component in modern deep neural networks. However, one of its disadvantages is its reliance on batch statistics that may be unreliable or unavailable during inference, particularly under test-time domain shifts. While batch-statistics-free affine transformation methods alleviate this by learning per-sample scale and shift parameters, most treat samples independently, overlooking temporal or sequential correlations in streaming or episodic test-time settings. We propose LSTM-Affine, a memory-based normalization module that replaces BN with a recurrent parameter generator. By leveraging an LSTM, the module produces channel-wise affine parameters conditioned on both the current input and its historical context, enabling gradual adaptation to evolving feature distributions. Unlike conventional batch-statistics-free designs, LSTM-Affine captures dependencies across consecutive samples, improving stability and convergence in scenarios with gradual distribution shifts. Extensive experiments on few-shot learning and source-free domain adaptation benchmarks demonstrate that LSTM-Affine consistently outperforms BN and prior batch-statistics-free baselines, particularly when adaptation data are scarce or non-stationary.
    Keywords: batch normalization; affine transformation; LSTM; test-time adaptation; memory-based learning; domain adaptation; few-shot learning; normalization-free networks; deep neural networks; feature distribution shift
    Relation: Electronics 14(21) ,p. 4251
    DOI: 10.3390/electronics14214251
    Appears in Collections:[資訊工程學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML49View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback