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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/128546


    Title: Imaging of Rough Surfaces by Near-Field Measurement
    Authors: Chien, Wei;Chiu, Chien-Ching;Chen, Po-Hsiang;Jiang, Hao;Chan, Shun-Jie
    Keywords: microwave imaging;near-field measurement;rough surfaces;self-adaptive dynamic differential evolution (SADDE)
    Date: 2021-07-06
    Issue Date: 2026-03-05 12:08:25 (UTC+8)
    Publisher: Sensors and Materials
    Relation: Sensors and Materials 33(7), p. 2333-2344
    DOI: 10.18494/SAM.2021.3282
    Appears in Collections:[電機工程學系暨研究所] 期刊論文

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