Product Acceptance Determination Based on EWMA Yield Index Using Repetitive and MDS Sampling Schemes

淡江大學機構典藏 > 工學院 > 人工智慧學系 > 期刊論文 > Item 987654321/127262

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题名:	Product Acceptance Determination Based on EWMA Yield Index Using Repetitive and MDS Sampling Schemes
作者:	Yen, Chien-ho
关键词:	Sampling plan;repetitive sampling;multiple dependent state sampling;normal distribution
日期:	2022-01-03
上传时间:	2025-03-24 12:05:22 (UTC+8)
摘要:	This study presents a repetitive group sampling plan and a multiple dependent state sampling plan based on the EWMA (exponentially weighted moving average) yield index for product acceptance. The proposed plans utilize the current and previous information through EWMA statistic to reach a decision of lot sentencing. A non-linear optimization model is developed to determine the plan parameters of the proposed plans for various specied conditions. The performance of the proposed plans over several existing sampling plans is analyzed, showing that the proposed plans are ecient in reducing the sample size for lot sentencing. For industrial application, a real example is given to demonstrate the implementation of the proposed plans.
關聯:	Scientia Iranica 29(4),　2241-2251
DOI:	10.24200/sci.2022.55480.4240
显示于类别:	[人工智慧學系] 期刊論文

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