A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices

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題名:	A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices
作者:	Yen, Ching-ho
關鍵詞:	Process capability indices;Repetitive sampling;Multiple dependent state;Average sample number;Operating characteristic curve
日期:	2023-03-31
上傳時間:	2025-03-24 12:05:15 (UTC+8)
摘要:	Process capability indices (PCIs) are efective quality tools for evaluating process performance in the manufacturing industry. Over a period of more than 15 years, sampling plans based on PCIs have been developed for lot sentencing. Sampling plans that involve repetitive sampling or multiple dependent (deferred) state sampling achieve signifcant sample size reductions relative to sampling plans that involve single sampling. In this study, we combine the concepts of repetitive and multiple dependent state sampling to propose a new variable sampling plan based on one-sided PCIs. The proposed sampling plan minimizes the average sample number while satisfying the principle of two points on the operating characteristic curve. To demonstrate the performance of the proposed sampling plan, a comparison with existing homogeneous sampling plans is performed.
關聯:	The International Journal of Advanced Manufacturing Technology 126(7),　3297-3309
DOI:	10.1007/s00170-023-11310-7
顯示於類別:	[人工智慧學系] 期刊論文

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