A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices

淡江大學機構典藏 > 工學院 > 人工智慧學系 > 期刊論文 > Item 987654321/127259

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题名:	A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices
作者:	Yen, Ching-ho
关键词:	Process capability indices;Repetitive sampling;Multiple dependent state;Average sample number;Operating characteristic curve
日期:	2023-03-31
上传时间:	2025-03-24 12:05:15 (UTC+8)
摘要:	Process capability indices (PCIs) are efective quality tools for evaluating process performance in the manufacturing industry. Over a period of more than 15 years, sampling plans based on PCIs have been developed for lot sentencing. Sampling plans that involve repetitive sampling or multiple dependent (deferred) state sampling achieve signifcant sample size reductions relative to sampling plans that involve single sampling. In this study, we combine the concepts of repetitive and multiple dependent state sampling to propose a new variable sampling plan based on one-sided PCIs. The proposed sampling plan minimizes the average sample number while satisfying the principle of two points on the operating characteristic curve. To demonstrate the performance of the proposed sampling plan, a comparison with existing homogeneous sampling plans is performed.
關聯:	The International Journal of Advanced Manufacturing Technology 126(7),　3297-3309
DOI:	10.1007/s00170-023-11310-7
显示于类别:	[人工智慧學系] 期刊論文

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