Research and Evaluation on an Optical Automatic Detection System for the Defects of the Manufactured Paper Cups

doi:10.3390/s23031452

機構典藏 > College of Engineering > Graduate Institute & Department of Electrical Engineering > Journal Article > Item 987654321/125584

Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/125584

Title:	Research and Evaluation on an Optical Automatic Detection System for the Defects of the Manufactured Paper Cups
Authors:	Ping Wang, Yang-Han Lee, Hsien-Wei Tseng, Cheng-Fu Yang
Keywords:	paper cup;optical automatic detection system;non-contact detection;processing technique
Date:	2023-01-28
Issue Date:	2024-07-30 12:06:06 (UTC+8)
Publisher:	MDPI
Abstract:	In this paper, the paper cups were used as the research objects, and the machine vision detection technology was combined with different image processing techniques to investigate a non-contact optical automatic detection system to identify the defects of the manufactured paper cups. The combined ring light was used as the light source, an infrared (IR) LED matrix panel was used to provide the IR light to constantly highlight the outer edges of the detected objects, and a multi-grid pixel array was used as the image sensor. The image processing techniques, including the Gaussian filter, Sobel operator, Binarization process, and connected component, were used to enhance the inspection and recognition of the defects existing in the produced paper cups. There were three different detection processes for paper cups, which were divided into internal, external, and bottom image acquisition processes. The present study demonstrated that all the detection processes could clearly detect the surface defect features of the manufactured paper cups, such as dirt, burrs, holes, and uneven thickness. Our study also revealed that the average time for the investigated Automatic Optical Detection to detect the defects on the paper cups was only 0.3 s.
Relation:	Sensors 23(3), 1452
DOI:	10.3390/s23031452
Appears in Collections:	[Graduate Institute & Department of Electrical Engineering] Journal Article

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