淡江大學機構典藏:Item 987654321/125512
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64198/96992 (66%)
造訪人次 : 7929982      線上人數 : 2547
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/125512


    題名: Research on microstructure and shear strength of Al alloy jointed by sputtered Cu thin film deposited through HiPIMS and DCMS techniques
    作者: Shih-Chieh Hsu, Yi-Hsin Huang, Sheng-Chi Chen, Chao-Kuang Wen, Wen-Sheng Yang, Ming-Han Liao, Tze-Yang Yeh, Ching-Ming Yang
    日期: 2023-05-04
    上傳時間: 2024-07-09 12:05:34 (UTC+8)
    出版者: Elsevier
    摘要: Transient liquid phase bonding (TLP bonding) in jointing technology is a promising method for achieving precision joining of aluminum alloys and creating low-cost products for use in the electric vehicles (EVs) industry, which can contribute to a low-carbon economy. This research is primarily focused on the jointing technology of aluminum alloys and is divided into two parts. The first part involves vacuum soldering between A6063 aluminum alloy with copper layers of 1, 3 and 5 μm thickness, and tin solder under thermal treatment. The second part is Cu-Al eutectic bonding. In this study, we used Ar ions to bombard the surface of A6063 aluminum alloy to remove the oxide layer and deposited a copper layer using direct-current magnetron sputtering (DCMS) and high-power impulse magnetron sputtering (HiPIMS). We then analyzed the joint interface of the samples using Scanning Electron Microscope (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), and Scanning Acoustic Tomography (SAT) to calculate the joint ratio of the entire joint surface. Finally, we measured the shear strength to evaluate the bonding effect. The results indicate that the eutectic bonding method exhibits better bonding performance for aluminum alloys compared to the soldering method. Furthermore, the shear strength increased with increasing thickness of the sputtered copper layer. When comparing two sputtering technologies, the copper films sputtered by HiPIMS system exhibit better quality those produced by the DCMS system. As a result, aluminum alloy bonding completed with HiPIMS has higher bonding strength, demonstrating that HiPIMS is a powerful coating tool.
    關聯: Surfaces and Interfaces 39, 102907
    DOI: 10.1016/j.surfin.2023.102907
    顯示於類別:[化學工程與材料工程學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML75檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋