English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62819/95882 (66%)
造访人次 : 4010651      在线人数 : 982
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/122551


    题名: Microstructural Evolution of Low-Temperature Solder Joints
    作者: Tseng, T.T.;Wu, G.W.;Liang, H.T.;Wang, Y.W.
    关键词: low-temperature solder;microstructure;temperature-sensitive devices
    日期: 2021-11-13
    上传时间: 2022-03-12 12:12:21 (UTC+8)
    摘要: Lead-free solder development is critical for semiconductor package. The properties of solder determine the process temperature and joint strength. SnAgCu and SnAg are the leading lead-free solder. However, the melting point is about 220oC, which is higher than former SnPb melting point. It is urgent to find low-temperature lead-free solder. The benefits of reducing process temperature include protection of device damage and energy-saving. Low carbon footprint reduces greenhouse effect that is friendly to environment. In this study, we choose Sn, Bi, and In elements as low-temperature solder candidates. Bi or In addition can reduce the melting point. In addition, In has good ductile and anti-corrosion. Observation of microstructure between low-temperature solder and Cu during solid-liquid and solid-solid reactions in this study. Reducing the process temperature is important for temperature-sensitive devices in order to avoid thermal damage. The composition of intermetallic compounds, phase transformation and mechanical properties are main objectives in this study.
    關聯: 中國材料科學學會國際會議暨年會
    显示于类别:[化學工程與材料工程學系暨研究所] 會議論文

    文件中的档案:

    档案 大小格式浏览次数
    index.html0KbHTML37检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈