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    題名: Microstructural Evolution of Low-Temperature Solder Joints
    作者: Tseng, T.T.;Wu, G.W.;Liang, H.T.;Wang, Y.W.
    關鍵詞: low-temperature solder;microstructure;temperature-sensitive devices
    日期: 2021-11-13
    上傳時間: 2022-03-12 12:12:21 (UTC+8)
    摘要: Lead-free solder development is critical for semiconductor package. The properties of solder determine the process temperature and joint strength. SnAgCu and SnAg are the leading lead-free solder. However, the melting point is about 220oC, which is higher than former SnPb melting point. It is urgent to find low-temperature lead-free solder. The benefits of reducing process temperature include protection of device damage and energy-saving. Low carbon footprint reduces greenhouse effect that is friendly to environment. In this study, we choose Sn, Bi, and In elements as low-temperature solder candidates. Bi or In addition can reduce the melting point. In addition, In has good ductile and anti-corrosion. Observation of microstructure between low-temperature solder and Cu during solid-liquid and solid-solid reactions in this study. Reducing the process temperature is important for temperature-sensitive devices in order to avoid thermal damage. The composition of intermetallic compounds, phase transformation and mechanical properties are main objectives in this study.
    關聯: 中國材料科學學會國際會議暨年會
    顯示於類別:[化學工程與材料工程學系暨研究所] 會議論文

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