English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62567/95223 (66%)
Visitors : 2519323      Online Users : 281
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/121942

    Title: CyberAid: are your children safe from cyberbullying?
    Authors: Lee Jia Thun;Phoey Lee Teh;Chi-Bin Cheng
    Keywords: Machine language;Cyberbully;Textual analysis;Hate speech;Human computer interface;Mobile application
    Date: 2021-03-11
    Issue Date: 2022-01-13 12:14:04 (UTC+8)
    Publisher: Elsevier BV
    Abstract: Researchers around the world have been implementing machine learning as a method to detect cyberbullying text. The machine is trained using features such as variations in texts, through social media context and interactions in a social network environment. The machine can also identify and profile users through gender or use of hate speech. In this study, we analysed different types of mobile applications that manage cyberbullying. This study proposes a mechanism, which combines the best cyberbullying detection features to fill the gaps and limitations of existing applications. The results of the study have shown that the proposed mobile application records a higher accuracy in detecting cyberbully than other available applications.
    Relation: Journal of King Saud University - Computer and Information Sciences 34, p.4099-4108
    DOI: 10.1016/j.jksuci.2021.03.001
    Appears in Collections:[Graduate Institute & Department of Information Management] Journal Article

    Files in This Item:

    File Description SizeFormat

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback