Abstract—The parallel constant-stress accelerated degradation
test (PCSADT) is a popular method used to assess the reliability
of highly reliable products in a timely manner. Although the maximum likelihood (ML) method is commonly utilized to estimate
the PCSADT parameters, the explicit forms of the ML estimators,
and their corresponding Fisher information matrix are usually
difficult to obtain. In this article, we propose a two-stage ML
(TSML) estimation procedure for a time-transformed model. In
the proposed procedure, all the TSML estimators not only have
explicit expressions but also possess consistency and asymptotic
normality. Hence, this method is tractable for reliability engineers.
Furthermore, the TSML estimators can provide constructive information about the unknown accelerated relationship law. The
proposed method is also applied to analyze light-emitting diode
data and compare the performance of our estimation procedures
with the ML method via simulations.
