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    Title: Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication
    Authors: Chen, Shuo-Han;Liang, Yu-Pei;Chang, Yuan-Hao;Wei, Hsin-Wen;Shih, Wei-Kuan
    Keywords: Random access memory;Nonvolatile memory;Power capacitors;Performance evaluation;Indexing;Consumer electronics;Three-dimensional displays
    Date: 2020-01-13
    Issue Date: 2020-07-28 12:10:48 (UTC+8)
    Publisher: IEEE
    Abstract: With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results.
    Relation: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)
    DOI: 10.1109/ASP-DAC47756.2020.9045622
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Proceeding

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