淡江大學機構典藏:Item 987654321/118819
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    题名: Package mTEXO for testing the presence of outliers in exponential samples.
    作者: Chien-Tai Lin, Ying Chen Lee, and N. Balakrishnan
    关键词: Critical value;Discordancy test;Exponential distribution;Spacings;User interface
    日期: 2018-10-04
    上传时间: 2020-07-01 12:10:37 (UTC+8)
    摘要: We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
    關聯: Computational Statistics 34(2), p.803–818
    DOI: 10.1007/s00180-018-0843-6
    显示于类别:[數學學系暨研究所] 期刊論文

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