淡江大學機構典藏:Item 987654321/118819
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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/118819


    Title: Package mTEXO for testing the presence of outliers in exponential samples.
    Authors: Chien-Tai Lin, Ying Chen Lee, and N. Balakrishnan
    Keywords: Critical value;Discordancy test;Exponential distribution;Spacings;User interface
    Date: 2018-10-04
    Issue Date: 2020-07-01 12:10:37 (UTC+8)
    Abstract: We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
    Relation: Computational Statistics 34(2), p.803–818
    DOI: 10.1007/s00180-018-0843-6
    Appears in Collections:[Graduate Institute & Department of Mathematics] Journal Article

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