English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 56562/90363 (63%)
造訪人次 : 11849285      線上人數 : 72
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/118813


    題名: Inverse Scattering of a Periodic Inhomogeneous Dielectric Scatterer
    作者: Chiu, Chien Ching;Hong, Bo Jie;Hao, Jiang
    關鍵詞: Microwave imaging;inhomogeneous dielectric scatterer;rough surface;Green’s identity;self-Adaptive dynamic Differential evolution (SADDE);Asynchronous particle Swarm optimization (APSO)
    日期: 2020-05-26
    上傳時間: 2020-07-01 12:10:17 (UTC+8)
    出版者: Taylor & Francis
    摘要: This paper is to reconstruct the periodic inhomogeneous dielectric distribution of the scatterer buried in the rough surface. In order to explore the dielectric coefficient distribution of the unknown dielectric object under the rough surface, we emit electromagnetic wave to the object and measure the scattered electromagnetic wave above the rough surface. Base on Green’s identity and the induced current concepts, the nonlinear integral equation can be derived and solved by the method of moments. Next, the inverse scattering problem is converted into an optimization problem. We use Self-Adaptive Dynamic Differential Evolution (SADDE) and Asynchronous Particle Swarm Optimization (APSO) to find the extreme value of the problem. With the regularization technique, the reconstruction is good. When the noise is less than 1%, the dielectric constant can also be achieved successfully. Numerical results show that SADDE can reduce the error for the permittivities of the object better than the APSO.
    關聯: Journal of Electromagnetic Waves and Applicationss 34(8), p.1015-1028
    DOI: 10.1080/09205071.2020.1769503
    顯示於類別:[電機工程學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML7檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋