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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/118308


    Title: 一種基於測試模式特性的低功耗測試架構
    Authors: 王嘉祥;饒建奇
    Keywords: 低功率消耗;切換活動;掃描移入模式;Low power;Switch activity;Scan-in pattern
    Date: 2019-11-08
    Issue Date: 2020-03-17 12:10:21 (UTC+8)
    Abstract: 超大型積體電路(VLSI)技術的推進,壓縮技術使得單個晶片中存在數十億個邏輯閘。VLSI技術的快速發展給設計和測試工程師帶來了新的困難,在這些困難中,大型測試的功耗是重要的問題之一。
    本文介紹了一種掃描架構,通過修改測試應用程序中的測試樣本,實現了高質量和低功耗測試。當測試樣本在每個移位中切換大量的掃描正反器,會降低電路的穩定性,造成故障驗證困難,產品良率下降和壽命縮短等,是個嚴重的問題。論文架構中解決了部分的位移功率,使用一個方法來降低掃描正反器切換次數,減少由測試樣本移入而引起的切換活動,該方法在掃描移入操作期間計算掃描正反器的切換活動,選擇合適的掃描路徑以移入測試樣本。
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Proceeding

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