Discussion of “Assessing the Goodness of Fit of Logistic Regression Models in Large Samples: A Modification of the Hosmer-Lemeshow Test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow

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Title:	Discussion of “Assessing the Goodness of Fit of Logistic Regression Models in Large Samples: A Modification of the Hosmer-Lemeshow Test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
Authors:	Li-Ching Chen;Jiun-Yi Wang
Date:	2020-01-02
Issue Date:	2020-03-07 12:10:49 (UTC+8)
Relation:	Biometrics 76(2), p.569-571
DOI:	10.1111/biom.13255
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article

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