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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/118192


    Title: Discussion of “Assessing the Goodness of Fit of Logistic Regression Models in Large Samples: A Modification of the Hosmer-Lemeshow Test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
    Authors: Li-Ching Chen;Jiun-Yi Wang
    Date: 2020-01-02
    Issue Date: 2020-03-07 12:10:49 (UTC+8)
    Relation: Biometrics 76(2), p.569-571
    DOI: 10.1111/biom.13255
    Appears in Collections:[統計學系暨研究所] 期刊論文

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