淡江大學機構典藏:Item 987654321/116748
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3939463      Online Users : 1008
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/116748


    Title: MEWMA control chart and process capability indices for simple linear profiles with within-profile autocorrelation
    Authors: Chiang, J-Y;Lio, YL;Tsai, Tzong-Ru
    Keywords: Autocorrelation;average run length;process capability analysis;profile monitoring
    Date: 2017-07
    Issue Date: 2019-05-22 12:44:16 (UTC+8)
    Abstract: A multivariate exponentially weighted moving average (MEWMA) control chart is proposed for detecting process shifts during the phase II monitoring of simple linear profiles (SLPs) in the presence of within‐profile autocorrelation. The proposed control chart is called MEWMA‐SLP. Furthermore, two process capability indices are proposed for evaluating the capability of in‐control SLP processes, and their utilization is demonstrated through examples. Intensive simulations reveal that the MEWMA‐SLP chart is more sensitive than existing control charts in detecting profile shifts. Copyright © 2016 John Wiley & Sons, Ltd.
    Relation: Quality and Reliability Engineering International 33(5), p.1083–1094
    Appears in Collections:[Graduate Institute & Department of Statistics] Journal Article

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML110View/Open
    MEWMA Control Chart and Process Capability Indices for Simple Linear Profiles with Within‐profile Autocorrelation.pdf494KbAdobe PDF1View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback