English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64178/96951 (66%)
造訪人次 : 9360082      線上人數 : 14168
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/115824


    題名: Estimation of the parameters and expected test time of exponentiated Weibull lifetimes under type II progressive censoring scheme with random removals
    作者: Fathy H. Eissa;Shuo-Jye Wu;Hamid H. Ahmed
    關鍵詞: progressive type-II censoring;random removals;maximum likelihood estimation;confidence interval;coverage probability;expected test time;exponentiated Weibull model
    日期: 2019-03
    上傳時間: 2019-02-23 12:12:10 (UTC+8)
    摘要: Based on progressive type-II censored sample with random removals, point and interval estimations for the shape parameters of the exponentiated Weibull distribution are discussed. Computational formula for the expected total test time are derived for different situations of sampling plans. This is useful in planning a life test experiment. The efficiency of the estimators are compared in terms of the root mean square error, the variance and the coverage probability of the corresponding confidence intervals. A simulation study is presented for several values of removal probability and different values of failure percentage. Also, numerical applications are conducted to illustrate and compare the usefulness of the different sampling plans in terms of expected test times for different patterns of failure rates.
    關聯: International Journal of Statistics and Probability 8(2), p.124-139
    DOI: 10.5539/ijsp.v8n2p124
    顯示於類別:[統計學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    Estimation of the Parameters and Expected Test Time of Exponentiated Weibull Lifetimes Under Type II Progressive Censoring Scheme With Random Removals.pdf1035KbAdobe PDF2檢視/開啟
    index.html0KbHTML173檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋