淡江大學機構典藏:Item 987654321/115397
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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/115397


    Title: Comparison of SIRM and SOM on Microwave Imaging of the Rough Surface
    Authors: Wei Chien;Chien-Ching Chiu;Chang-En Wu
    Date: 2018-09
    Issue Date: 2018-10-25 12:10:28 (UTC+8)
    Relation: Journal of Applied Science and Engineering 21(3), p.305-315
    DOI: 10.6180/jase.201809_21(3).0002
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

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