淡江大學機構典藏:Item 987654321/115397
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3993666      Online Users : 294
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
    •  Adv. Search
    Home ‧ Login ‧ Upload ‧ Help ‧ About ‧ Administer Goto mobile version


    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/115397


    Title: Comparison of SIRM and SOM on Microwave Imaging of the Rough Surface
    Authors: Wei Chien;Chien-Ching Chiu;Chang-En Wu
    Date: 2018-09
    Issue Date: 2018-10-25 12:10:28 (UTC+8)
    Relation: Journal of Applied Science and Engineering 21(3), p.305-315
    DOI: 10.6180/jase.201809_21(3).0002
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

    Files in This Item:

    File Description SizeFormat
    Comparison of SIRM and SOM on Microwave Imaging of the Rough Surface.pdf1166KbAdobe PDF2View/Open
    index.html0KbHTML148View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback