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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/115216


    Title: Package mTEXO for testing the presence of outliers in exponential samples
    Authors: Chien-Tai Lin;Ying-Chen Lee;Narayanaswamy Balakrishnan
    Keywords: Critical value;Discordancy test;Exponential distribution;Spacings;User interface
    Date: 2018-10-04
    Issue Date: 2018-10-18 12:10:38 (UTC+8)
    Publisher: Springer Berlin Heidelberg
    Abstract: We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
    Relation: Computational Statistics 34(2), p.803–818
    DOI: 10.1007/s00180-018-0843-6
    Appears in Collections:[Graduate Institute & Department of Mathematics] Journal Article

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