淡江大學機構典藏:Item 987654321/115187
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62797/95867 (66%)
造访人次 : 3732850      在线人数 : 382
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/115187


    题名: A Novel Method Guiding IC Manufacturing R&D Direction: Perspective from Knowledge Integration Innovation
    作者: Han-Jen Niu;Chao-Jung Chang
    关键词: Integrated innovation method;R&D management;Virtual sensors;Knowledge management;Multivariate statistical analysis;IC manufacturing
    日期: 2018-08
    上传时间: 2018-10-11 12:11:17 (UTC+8)
    摘要: Integrated circuit (IC) manufacturing involves complex processes and may
    require months to complete. Thousands of messages will be generated during each process,
    and most messages can easily be identified and analyzed. However, ambiguous information remains as a kind of tacit knowledge that is one of the most essential issues of R&D
    management. Integrated innovation is an application of scientific/technological creative
    solutions to complex processes. This research uses a case study of a semiconductor company in Hsinchu Science Park in northern Taiwan. Traditional methods only yield the
    results inferred from explicit knowledge, and omit the results based on tacit knowledge.
    The integrated method can be designated as a clear direction for the R&D which uses
    the multivariate statistical analysis as virtual sensors. By involving Hotelling T2, and
    the principal component analysis (PCA), to generate specific results corresponding to the
    core of the high density plasma chemical vapor deposition (HDP CVD) equipment or
    process, eliminate inaccurate information using the experience rating in a 12-inch fab.
    This provides an approach that can guide the R&D engineers and illuminate the entire
    process. In sum, both process stabilization and cost savings are the major advantages of
    virtual sensors.
    關聯: International Journal of Innovative Computing, Information and Control, 14(4), p.1371-1388
    DOI: 10.24507/ijicic.14.04.1371
    显示于类别:[管理科學學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    A Novel Method Guiding IC Manufacturing R_D Direction Perspective from Knowledge Integration Innovation.pdf1813KbAdobe PDF0检视/开启
    index.html0KbHTML147检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈