English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 63187/95884 (66%)
造訪人次 : 4579968      線上人數 : 294
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/115187

    題名: A Novel Method Guiding IC Manufacturing R&D Direction: Perspective from Knowledge Integration Innovation
    作者: Han-Jen Niu;Chao-Jung Chang
    關鍵詞: Integrated innovation method;R&D management;Virtual sensors;Knowledge management;Multivariate statistical analysis;IC manufacturing
    日期: 2018-08
    上傳時間: 2018-10-11 12:11:17 (UTC+8)
    摘要: Integrated circuit (IC) manufacturing involves complex processes and may
    require months to complete. Thousands of messages will be generated during each process,
    and most messages can easily be identified and analyzed. However, ambiguous information remains as a kind of tacit knowledge that is one of the most essential issues of R&D
    management. Integrated innovation is an application of scientific/technological creative
    solutions to complex processes. This research uses a case study of a semiconductor company in Hsinchu Science Park in northern Taiwan. Traditional methods only yield the
    results inferred from explicit knowledge, and omit the results based on tacit knowledge.
    The integrated method can be designated as a clear direction for the R&D which uses
    the multivariate statistical analysis as virtual sensors. By involving Hotelling T2, and
    the principal component analysis (PCA), to generate specific results corresponding to the
    core of the high density plasma chemical vapor deposition (HDP CVD) equipment or
    process, eliminate inaccurate information using the experience rating in a 12-inch fab.
    This provides an approach that can guide the R&D engineers and illuminate the entire
    process. In sum, both process stabilization and cost savings are the major advantages of
    virtual sensors.
    關聯: International Journal of Innovative Computing, Information and Control, 14(4), p.1371-1388
    DOI: 10.24507/ijicic.14.04.1371
    顯示於類別:[管理科學學系暨研究所] 期刊論文


    檔案 描述 大小格式瀏覽次數
    A Novel Method Guiding IC Manufacturing R_D Direction Perspective from Knowledge Integration Innovation.pdf1813KbAdobe PDF0檢視/開啟



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋