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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/114750


    Title: 多型樣式數位相移條紋投影術應用於三維多樣表面輪廓量測
    Other Titles: Multi-pattern digital phase-shifting fringe projection for three-dimensional various surface profilometry
    Authors: 王仲毅;Wang, Chung-Yi
    Contributors: 淡江大學機械與機電工程學系碩士班
    劉承揚
    Keywords: Digital structured light;phase-shift technique;three-dimensional surface measurement;三維曲面量測;相位移技術;數位結構光投影
    Date: 2017
    Issue Date: 2018-08-03 15:02:46 (UTC+8)
    Abstract: 本論文使用三種波形(餘弦波、方波、三角波)的數位條紋結構光,再加上七步相位移法、相位展開技術、參考平面扣除法來量測不同的三維表面輪廓,量測試件包含半圓形、內凹半圓、方形、三角形等形狀。量測系統是將數位結構光法投影至待測物上,然後以數位攝影機擷取條紋影像,最後使用多步相位移技術計算出物體表面的三維輪廓。實驗結果顯示,不同波形的結構光在量測不同樣式的待測物時會達到不同的效果。餘弦波對於半圓形試件有較小的量測誤差(1.27%),方波則對於方形試件有較小的量測誤差(15.66%),而三角波則對於三角形試件有較小的量測誤差(10.18%)。未來應用於產品的即時檢測時,可針對輪廓形狀來選擇較適合的條紋結構光進行量測,以獲得最小誤差的三維表面輪廓。
    In this thesis, different three-dimensional surfaces were measured by three kinds of waveforms (cosine wave, square wave, triangular wave) of digital structured light projection, seven-step phase shifting, phase unwrapping, reference plane subtraction method. The measured objects include semi-circular, concave semi-circular, square and triangle. In this system, digital structured light is projected onto the objects, and then the fringe pattern images are captured with CCD. Finally, the three-dimensional surfaces of the objects are calculated by multi-step phase-shifting. As the results, different objects achieved different effect by using different kinds of waveforms of digital structured light. The semi-circular objects measured by cosine wave have smaller measurement error (1.27%). The square objects measured by square wave have smaller measurement error (15.66%). The triangular objects measured by triangular wave have smaller measurement error (10.18%). In order to get the minimum error of the three-dimensional surfaces profile, it is selected more appropriate fringe pattern structured light to measure according to objects profile, which is used for product immediate detection.
    Appears in Collections:[Graduate Institute & Department of Mechanical and Electro-Mechanical Engineering] Thesis

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