English  |  正體中文  |  简体中文  |  Items with full text/Total items : 64178/96951 (66%)
Visitors : 10091465      Online Users : 20092
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/114268


    Title: 比例風險模型下現狀數據的樣本數計算
    Other Titles: Sample size calculations for the proportional hazards model with current status data
    Authors: 鄭惟綸;Cheng, Wei-Lun
    Contributors: 淡江大學數學學系碩士班
    温啟仲;Wen, Chi-Chung
    Keywords: 存活分析;檢定力;韋伯分佈;Survival Analysis;Test power;Weibull distribution
    Date: 2017
    Issue Date: 2018-08-03 14:47:06 (UTC+8)
    Abstract: 在人口統計調查與生物醫學研究中,常常遇到現狀設限存活資料,觀測值包含檢查時間及關心的事件是否已經發生的現狀資料。在臨床試驗設計或是人口調查研究的樣本數是很重要的課題。本論文中,在基線模型為一般分佈的比例風險模型下,我們提出一個需給定對應參數,具封閉形式的樣本數公式,以Weibull及Log-logistic作為舉例,並藉由進行模擬試驗及兩個實例驗證公式的正確性。
    Current status data are commonly encountered in demographical or biomedical studies, where the event of interest is observed or examined once and the only available information consists of an examination time and an indicator of whether the event has occurred by the examination time. Sample size calculations is important for designing survival studies with current status data. In this thesis, we propose a closed form sample size formula for current status data under a flexible parametric proportional hazards model, including Weibull and log-logistic baseline hazards as special cases. The proposed methods are evaluated through simulations studies and illustrated with two real examples.
    Appears in Collections:[應用數學與數據科學學系] 學位論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML253View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback