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    題名: Electronic structure of Cr doped Fe3O4 thin films by X-ray absorption near-edge structure spectroscopy
    作者: Dong, Chung-li;Chang, C.L.
    關鍵詞: Thin films;MBE;Magnetite;X-ray absorption spectroscopy
    日期: 2018-01-31
    上傳時間: 2018-06-09 12:10:14 (UTC+8)
    出版者: Elsevier Ltd.
    摘要: Present study reports the electronic structures of Cr doped Fe3O4 (Fe3-xCrxO4 (0 x 3) grown on MgO (100)
    substrates in the form of thin films fabricated by a plasma–oxygen assisted Molecular Beam Epitaxy (MBE). X-ray
    absorption near-edge structure (XANES) spectra at Cr & Fe L-, and O K-edges were used to understand the
    electronic structure: changes in the bonding nature, valence states, and site occupancies. Cr doping in Fe3O4
    results in the change of charge transfer, crystal structure, and selective occupation of ions in octahedral and
    tetrahedral sites. Such change modifies the electrical and magnetic properties due to the covalency of Cr ions. The
    physical and chemical properties of ferrites are strongly dependent on the lattice site, ion size of dopant, and
    magnetic nature present at different structural symmetry of the spinel structure.
    關聯: Solid State Communications 272, p.48-52
    DOI: 10.1016/j.ssc.2018.01.011
    顯示於類別:[物理學系暨研究所] 期刊論文

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