Through-Wall Imaging of Conductors by Transverse Electric Wave Illumination

淡江大學機構典藏 > 工學院 > 電機工程學系暨研究所 > 期刊論文 > Item 987654321/112838

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题名:	Through-Wall Imaging of Conductors by Transverse Electric Wave Illumination
作者:	Wei Chien;Chien-Ching Chiu;Wei-Siang Gu
日期:	2017-12
上传时间:	2018-03-02 12:14:26 (UTC+8)
摘要:	A novel method for through-wall imaging (TWI) illuminated by the transverse electric (TE) waves is presented. Most microwave inverse scattering algorithms developed are for transverse magnetic (TM) wave illumination in which vector problem can be simplified to a scalar one, which less works have been reported on the more complicated TE case. In the TE case, the presence of polarization charges makes the inverse problem more nonlinear. This paper uses the self-adaptive dynamic differential evolution (SADDE) algorithm to recover the shapes of the two dimensional conducting cylinders by TE plane wave illumination. Based on the boundary condition and the measured scattered field, a set of nonlinear integral equation is derived and the imaging problem is reformulated into optimization problem. The SADDE algorithm is employed to find out the global extreme solution of the object function. Numerical results show that the shapes of the conductor are well reconstructed. In addition, the effect of Gaussian noise on the reconstruction is investigated.
關聯:	Journal of Applied Science and Engineering 20(4), p.477-482
DOI:	10.6180/jase.2017.20.4.09
显示于类别:	[電機工程學系暨研究所] 期刊論文

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