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    題名: Through-Wall Imaging of Conductors by Transverse Electric Wave Illumination
    作者: Wei Chien;Chien-Ching Chiu;Wei-Siang Gu
    日期: 2017-12
    上傳時間: 2018-03-02 12:14:26 (UTC+8)
    摘要: A novel method for through-wall imaging (TWI) illuminated by the transverse electric (TE)
    waves is presented. Most microwave inverse scattering algorithms developed are for transverse
    magnetic (TM) wave illumination in which vector problem can be simplified to a scalar one, which
    less works have been reported on the more complicated TE case. In the TE case, the presence of
    polarization charges makes the inverse problem more nonlinear. This paper uses the self-adaptive
    dynamic differential evolution (SADDE) algorithm to recover the shapes of the two dimensional
    conducting cylinders by TE plane wave illumination. Based on the boundary condition and the
    measured scattered field, a set of nonlinear integral equation is derived and the imaging problem is
    reformulated into optimization problem. The SADDE algorithm is employed to find out the global
    extreme solution of the object function. Numerical results show that the shapes of the conductor are
    well reconstructed. In addition, the effect of Gaussian noise on the reconstruction is investigated.
    關聯: Journal of Applied Science and Engineering 20(4), p.477-482
    DOI: 10.6180/jase.2017.20.4.09
    顯示於類別:[電機工程學系暨研究所] 期刊論文

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