English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 58325/91879 (63%)
造访人次 : 1415      在线人数 : 120
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/112393

    题名: A High-Resolution All-Digital Temperature Sensor with Process Variation Compensation
    作者: Yu-Lung Lo;Wei-Tsuen Chen;Yu-Ting Chiu;Wei-Bin Yang,
    关键词: CMOS temperature sensor;thermal sensor;ring oscillator;all digital;process variation compensation
    日期: 2016-05-25
    上传时间: 2017-12-13 02:10:40 (UTC+8)
    摘要: In this paper, we propose a high-resolution all-digital complementary metal–oxide
    semiconductor (CMOS) temperature sensor with a ring oscillator for temperature sensing and power
    supply immunity, a time amplifier for process variation compensation, and serial digital output for
    low area consumption. Because of the linearity of its high output cycle–temperature, the sensor
    has excellent measurement accuracy; the architecture of the sensor effectively decreased power
    supply sensitivity, and the parallel-to-serial converter considerably reduced area consumption. In
    addition, the high resolution is determined by the time amplifier with external digital codes. The
    determination of resolution using the time amplifier and the process variation compensation were
    accomplished simultaneously. The temperature sensor was fabricated using 0.18-μm standard
    CMOS technology, and the core circuit occupies an area of 0.001 mm2. The experimental results
    indicated that the energy per conversion rate was only 10 nJ at a supply voltage of 1.8 V; the
    conversion rate was 15–30 k samples/s, and the error in temperature sensing ranged from −1.58 to
    +1.6 °C with a resolution higher than 0.1 °C after one-point calibration in the −40 to +130 °C range.
    With these advantages, the temperature sensor is suitable for application in large integrated circuit (IC)
    systems and three-dimensional ICs.
    關聯: Sensors and Materials 28(5), p.395–402
    DOI: 10.18494/SAM.2016.1292
    显示于类别:[電機工程學系暨研究所] 期刊論文


    档案 描述 大小格式浏览次数
    A High-Resolution All-Digital Temperature Sensor with Process Variation Compensation.pdf1044KbAdobe PDF0检视/开启



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈