淡江大學機構典藏:Item 987654321/112174
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 60868/93650 (65%)
造訪人次 : 1150691      線上人數 : 32
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/112174


    題名: A Survey of the Modeling and Application on Non-destructive and Destructive Degradation Tests
    作者: Tsai, C. C.;Lin, C. T.;Balakrishnan, N.
    關鍵詞: Highly reliable products;Quality characteristics;Degradation data;Linearized and nonlinear degradation paths
    日期: 2017-09
    上傳時間: 2017-11-21 02:11:11 (UTC+8)
    出版者: Springer Singapore
    摘要: These days, most products are highly reliable which makes it very difficult or even impossible to obtain failure data on such products within a reasonable period of time prior to product release. Degradation tests are one way to overcome this obstacle by collecting degradation data (measurement of degradation) on such products. Based on different measurement processes, degradation tests can be divided into non-destructive and destructive degradation tests. In this chapter, we discuss a number of these two types of degradation models that have been developed in the literature to describe the degradation paths of products. In addition, some applications of degradation models of these two classes are also discussed.
    關聯: Statistical Modeling for degradation data
    DOI: 10.1007/978-981-10-5194-4_6
    顯示於類別:[數學學系暨研究所] 專書之單篇

    文件中的檔案:

    沒有與此文件相關的檔案.

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋