淡江大學機構典藏:Item 987654321/112174
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/112174


    Title: A Survey of the Modeling and Application on Non-destructive and Destructive Degradation Tests
    Authors: Tsai, C. C.;Lin, C. T.;Balakrishnan, N.
    Keywords: Highly reliable products;Quality characteristics;Degradation data;Linearized and nonlinear degradation paths
    Date: 2017-09
    Issue Date: 2017-11-21 02:11:11 (UTC+8)
    Publisher: Springer Singapore
    Abstract: These days, most products are highly reliable which makes it very difficult or even impossible to obtain failure data on such products within a reasonable period of time prior to product release. Degradation tests are one way to overcome this obstacle by collecting degradation data (measurement of degradation) on such products. Based on different measurement processes, degradation tests can be divided into non-destructive and destructive degradation tests. In this chapter, we discuss a number of these two types of degradation models that have been developed in the literature to describe the degradation paths of products. In addition, some applications of degradation models of these two classes are also discussed.
    Relation: Statistical Modeling for degradation data
    DOI: 10.1007/978-981-10-5194-4_6
    Appears in Collections:[Graduate Institute & Department of Mathematics] Chapter

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