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    题名: A Survey of the Modeling and Application on Non-destructive and Destructive Degradation Tests
    作者: Tsai, C. C.;Lin, C. T.;Balakrishnan, N.
    关键词: Highly reliable products;Quality characteristics;Degradation data;Linearized and nonlinear degradation paths
    日期: 2017-09
    上传时间: 2017-11-21 02:11:11 (UTC+8)
    出版者: Springer Singapore
    摘要: These days, most products are highly reliable which makes it very difficult or even impossible to obtain failure data on such products within a reasonable period of time prior to product release. Degradation tests are one way to overcome this obstacle by collecting degradation data (measurement of degradation) on such products. Based on different measurement processes, degradation tests can be divided into non-destructive and destructive degradation tests. In this chapter, we discuss a number of these two types of degradation models that have been developed in the literature to describe the degradation paths of products. In addition, some applications of degradation models of these two classes are also discussed.
    關聯: Statistical Modeling for degradation data
    DOI: 10.1007/978-981-10-5194-4_6
    显示于类别:[數學學系暨研究所] 專書之單篇

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