Assessment of Modelling Longitudinal Binary Data Based on Graphical Methods

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Title:	Assessment of Modelling Longitudinal Binary Data Based on Graphical Methods
Authors:	Lin, Kuo-Chin;Chen, Yi-Ju
Keywords:	GEE;Goodness-of-fit;Kernel smoothing;Local mean deviance plot;Longitudinal binary response;Marginal model plot
Date:	2017-02-01
Issue Date:	2017-07-04 02:11:28 (UTC+8)
Publisher:	Taylor & Francis Inc.
Abstract:	Longitudinal categorical data are commonly applied in a variety of fields and are frequently analyzed by generalized estimating equation (GEE) method. Prior to making further inference based on the GEE model, the assessment of model fit is crucial. Graphical techniques have long been in widespread use for assessing the model adequacy. We develop alternative graphical approaches utilizing plots of marginal model-checking condition and local mean deviance to assess the GEE model with logit link for longitudinal binary responses. The applications of the proposed procedures are illustrated through two longitudinal binary datasets.
Relation:	Communications in Statistics-Theory and Methods 46(7), p.3426–3437
DOI:	10.1080/03610926.2015.1062107
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article

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