Optimizing the Structure of a Four-axis Polarized Scattering Instrument using a Double-loop Approach

淡江大學機構典藏 > 工學院 > 機械與機電工程學系暨研究所 > 會議論文 > Item 987654321/110383

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題名:	Optimizing the Structure of a Four-axis Polarized Scattering Instrument using a Double-loop Approach
作者:	Shih, Chien-Jong;Teng, Tso-Liang;Huang, Yong-An
關鍵詞:	Equipment and services;Scattering;Structural design;Finite element methods;Product engineering
日期:	2013-08-08
上傳時間:	2017-06-13 02:10:53 (UTC+8)
摘要:	A new four-axis polarized scattering instrument is presented in this paper. In order to capture instrumental characteristics, the finite element analysis has been utilized to investigate the static behaviors such as the structural volume and tip deflection. Both topological and parametric optimization in presenting double-loop approach results in optimum material distribution and volume fraction. The resulting optimum model has been further modified to a solid prototype for final product design. The ultimate result shows that the tip deflection, material volume can evidently be optimized so that the enhancement of instrumental precision can be achieved. The proposed exploration of process and skill can provide for general mechanical structural design in creative sense. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
關聯:	Proceedings of International Symposium on Precision Mechanical Measurements ( ISPMM2013), Paper No. PMM13-MM100-50
DOI:	10.1117/12.2035632
顯示於類別:	[機械與機電工程學系暨研究所] 會議論文

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