English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62567/95223 (66%)
造訪人次 : 2518686      線上人數 : 56
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/110383

    題名: Optimizing the Structure of a Four-axis Polarized Scattering Instrument using a Double-loop Approach
    作者: Shih, Chien-Jong;Teng, Tso-Liang;Huang, Yong-An
    關鍵詞: Equipment and services;Scattering;Structural design;Finite element methods;Product engineering
    日期: 2013-08-08
    上傳時間: 2017-06-13 02:10:53 (UTC+8)
    摘要: A new four-axis polarized scattering instrument is presented in this paper. In order to capture instrumental characteristics, the finite element analysis has been utilized to investigate the static behaviors such as the structural volume and tip deflection. Both topological and parametric optimization in presenting double-loop approach results in optimum material distribution and volume fraction. The resulting optimum model has been further modified to a solid prototype for final product design. The ultimate result shows that the tip deflection, material volume can evidently be optimized so that the enhancement of instrumental precision can be achieved. The proposed exploration of process and skill can provide for general mechanical structural design in creative sense. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
    關聯: Proceedings of International Symposium on Precision Mechanical Measurements ( ISPMM2013), Paper No. PMM13-MM100-50
    DOI: 10.1117/12.2035632
    顯示於類別:[機械與機電工程學系暨研究所] 會議論文


    檔案 描述 大小格式瀏覽次數



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋