Optimal two-variable accelerated degradation test plan for gamma degradation process

doi:10.1109/TR.2015.2435774

淡江大學機構典藏 > 商管學院 > 統計學系暨研究所 > 期刊論文 > Item 987654321/110018

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题名:	Optimal two-variable accelerated degradation test plan for gamma degradation process
作者:	Tzong-Ru Tsai;Wen-Yun Sung;Y. L. Lio;Shing I. Chang;Jye-Chyi Lu
关键词:	inverse Gaussian distribution;Bonferroni's inequality;Brownian motion process;cumulative exposure model;gamma process;geometric Brownian motion process
日期:	2016-03
上传时间:	2017-03-17 02:11:05 (UTC+8)
出版者:	Institute of Electrical and Electronics Engineers
摘要:	An accelerated degradation test (ADT) can be used to assess the reliability of highly reliable products by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a constant-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the total cost, an optimal ADT procedure was established to minimize the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a constant measurement frequency were determined. An algorithm is provided to achieve an optimal ADT plan. An extensive Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation data set of light emitting diodes is presented to illustrate the proposed method.
關聯:	IEEE Transactions on Reliability 65(1), p.459-468
DOI:	10.1109/TR.2015.2435774
显示于类别:	[統計學系暨研究所] 期刊論文

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