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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/109426

    Title: Energy relaxation dynamics in vertically coupled multi-stacked InAs/GaAs quantum dots
    Authors: Antaryami Mohanta;Der-Jun Jang;Shu-Kai Lu;Dah-Chin Ling;J. S. Wang
    Date: 2017-01-19
    Issue Date: 2017-02-14 02:11:06 (UTC+8)
    Publisher: A I P Publishing LLC
    Abstract: Effect of GaAs spacer layer thickness (dGaAs) on carrier capture, and the relaxation process is studied in multi-stacked InAs/GaAs quantum dots by photoluminescence and time-resolved photoluminescence. Auger scattering is the dominating process for carrier relaxation above dGaAs of 15 nm. At dGaAs of 10 nm, the carrier relaxation process is faster due to the combined effect of both single longitudinal optical phonon and Auger scattering resulting in higher photoluminescence intensity. The photoluminescence rise time corresponding to carrier capture and relaxation in quantum dots is longer at 3.06 eV excitation than that at 1.53 eV due to the effect of intervalley scattering in GaAs.
    Relation: Applied Physics Letters 110(3), 033107(4 pages)
    DOI: 10.1063/1.4974221
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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