Efficient Method for Testing the Batch-Processing Process Yield

淡江大學機構典藏 > 淡江出版期刊 > 資訊與管理科學期刊 > 第27卷第1期 > Item 987654321/109375

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題名:	Efficient Method for Testing the Batch-Processing Process Yield
作者:	Liao, Mou-Yuan;Wu, Chien-Wei
關鍵詞:	Generalized confidence interval;multiple batches;process yield
日期:	2016
上傳時間:	2017-01-17 10:57:00 (UTC+8)
出版者:	淡江大學出版中心
摘要:	Batch manufacturing processes have been widely used in various manufacturing processes, such as wafer fabrication, IC fabrication, and gridline printing process in the solar battery fabrication. In a batch manufacturing process, products are produced batch-by-batch. Thus, total process variations are generally divided into batch-by-batch variation and within-batch variation. The main purpose of this study is to provide an efficient method for testing the batch-processing process yield. Base on the one-way random effect model, the generalized pivotal quantity is utilized to establish the generalized confidence interval for assessing the process yield index. By simulations, the proposed method shows that its empirical coverage probability is not affected by the batch effect, and is still close the nominal coverage probability as the batch size increases.
關聯:	International Journal of Information and Management Sciences 27(1), pp.1-16
DOI:	10.6186/IJIMS.2016.27.1.1
顯示於類別:	[資訊與管理科學期刊] 第27卷第1期

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