English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 49064/83169 (59%)
造访人次 : 6959961      在线人数 : 45
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/109375


    题名: Efficient Method for Testing the Batch-Processing Process Yield
    作者: Liao, Mou-Yuan;Wu, Chien-Wei
    关键词: Generalized confidence interval;multiple batches;process yield
    日期: 2016
    上传时间: 2017-01-17 10:57:00 (UTC+8)
    出版者: 淡江大學出版中心
    摘要: Batch manufacturing processes have been widely used in various manufacturing processes, such as wafer fabrication, IC fabrication, and gridline printing process in the solar battery fabrication. In a batch manufacturing process, products are produced batch-by-batch. Thus, total process variations are generally divided into batch-by-batch variation and within-batch variation. The main purpose of this study is to provide an efficient method for testing the batch-processing process yield. Base on the one-way random effect model, the generalized pivotal quantity is utilized to establish the generalized confidence interval for assessing the process yield index. By simulations, the proposed method shows that its empirical coverage probability is not affected by the batch effect, and is still close the nominal coverage probability as the batch size increases.
    關聯: International Journal of Information and Management Sciences 27(1), pp.1-16
    DOI: 10.6186/IJIMS.2016.27.1.1
    显示于类别:[資訊與管理科學期刊] 第27卷第1期

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html全文連結0KbHTML33检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈