English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 56431/90260 (63%)
造访人次 : 11697814      在线人数 : 44
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/109110

    题名: Lifetime inference for highly reliable products based on skew-normal accelerated destructive degradation test model
    作者: Tsai, Chih-Chun;Lin, Chien-Tai
    关键词: model mis-specification;Accelerated destructive degradation tests;expectation-maximization algorithm;highly reliable products;skew-normal distribution
    日期: 2016-06-27
    上传时间: 2017-01-06 02:10:54 (UTC+8)
    摘要: The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product's lifetime distribution along with its corresponding 100pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model. Finally, we addressed analytically the effects of model mis-specification when the skewness of measurement error are mistakenly treated, and the obtained results reveal that the impact from the skewness parameter on the accuracy and precision of the prediction of the lifetimes of products is quite significant.
    關聯: IEEE Transactions on Reliability 64(4), pp.1340-1355
    DOI: 10.1109/TR.2015.2419618
    显示于类别:[數學學系暨研究所] 會議論文


    档案 描述 大小格式浏览次数
    Lifetime inference for highly reliable products based on skew-normal accelerated destructive degradation test model_議程.pdf15301KbAdobe PDF249检视/开启



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈