Testing for multiple upper and lower outliers in an exponential sample

淡江大學機構典藏 > 理學院 > 數學學系暨研究所 > 期刊論文 > Item 987654321/108279

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题名:	Testing for multiple upper and lower outliers in an exponential sample
作者:	Nirpeksh Kumar;Chien-Tai Lin
关键词:	Reliability;outlier;slippage alternative;discordancy;performance
日期:	2017-05
上传时间:	2016-11-16 02:10:48 (UTC+8)
出版者:	Taylor & Francis
摘要:	Due to wide applicability and simplicity, the exponential distribution is the most commonly used distribution in reliability engineering and other life testing experiments. In this paper a test statistic for testing upper and lower outliers simultaneously in an exponential sample is proposed. However, the distribution of test statistic under the alternative is rather intricate, the null distribution is derived and critical values are obtained. A simulation study is also carried out to compare the performance of test and is found that the test based on this statistic is more powerful than the other two selected tests.
關聯:	Journal of Statistical Computation and Simulation 87(5), p.870-881
DOI:	10.1080/00949655.2016.1232723
显示于类别:	[數學學系暨研究所] 期刊論文

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