English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62830/95882 (66%)
Visitors : 4043775      Online Users : 962
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/108279


    Title: Testing for multiple upper and lower outliers in an exponential sample
    Authors: Nirpeksh Kumar;Chien-Tai Lin
    Keywords: Reliability;outlier;slippage alternative;discordancy;performance
    Date: 2017-05
    Issue Date: 2016-11-16 02:10:48 (UTC+8)
    Publisher: Taylor & Francis
    Abstract: Due to wide applicability and simplicity, the exponential distribution is the most commonly used distribution in reliability engineering and other life testing experiments. In this paper a test statistic for testing upper and lower outliers simultaneously in an exponential sample is proposed. However, the distribution of test statistic under the alternative is rather intricate, the null distribution is derived and critical values are obtained. A simulation study is also carried out to compare the performance of test and is found that the test based on this statistic is more powerful than the other two selected tests.
    Relation: Journal of Statistical Computation and Simulation 87(5), p.870-881
    DOI: 10.1080/00949655.2016.1232723
    Appears in Collections:[數學學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML194View/Open
    Testing for multiple upper and lower outliers in an exponential sample.pdf1297KbAdobe PDF2View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback