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    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/108279

    題名: Testing for multiple upper and lower outliers in an exponential sample
    作者: Nirpeksh Kumar;Chien-Tai Lin
    關鍵詞: Reliability;outlier;slippage alternative;discordancy;performance
    日期: 2017-05
    上傳時間: 2016-11-16 02:10:48 (UTC+8)
    出版者: Taylor & Francis
    摘要: Due to wide applicability and simplicity, the exponential distribution is the most commonly used distribution in reliability engineering and other life testing experiments. In this paper a test statistic for testing upper and lower outliers simultaneously in an exponential sample is proposed. However, the distribution of test statistic under the alternative is rather intricate, the null distribution is derived and critical values are obtained. A simulation study is also carried out to compare the performance of test and is found that the test based on this statistic is more powerful than the other two selected tests.
    關聯: Journal of Statistical Computation and Simulation 87(5), p.870-881
    DOI: 10.1080/00949655.2016.1232723
    顯示於類別:[數學學系暨研究所] 期刊論文


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