淡江大學機構典藏:Item 987654321/107573
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/107573


    Title: Study for Reaching a Degradation Test Plan
    Authors: Tsai, Tzong-Ru;Lio, Y. L.
    Keywords: Brownian motion process;Gamma process;geometric Brownian motion process;generalized Eyring model;inverse Gaussian distribution
    Date: 2016-03-27
    Issue Date: 2016-09-27 02:10:55 (UTC+8)
    Abstract: In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm.
    Relation: Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016
    Appears in Collections:[Graduate Institute & Department of Statistics] Proceeding

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