In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm.
關聯:
Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016