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    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/107573

    題名: Study for Reaching a Degradation Test Plan
    作者: Tsai, Tzong-Ru;Lio, Y. L.
    關鍵詞: Brownian motion process;Gamma process;geometric Brownian motion process;generalized Eyring model;inverse Gaussian distribution
    日期: 2016/03/27
    上傳時間: 2016-09-27 02:10:55 (UTC+8)
    摘要: In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm.
    關聯: Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016
    顯示於類別:[統計學系暨研究所] 會議論文


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