淡江大學機構典藏:Item 987654321/107087
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62797/95867 (66%)
造訪人次 : 3743963      線上人數 : 563
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/107087


    題名: In-situ/operando soft X-ray spectroscopy characterization of interfacial phenomena in energy materials and devices
    作者: Liu, Y.-S.;Glans, P.-A.;Arthur, T.S.;Mizuno, F.;Chang, C.;Pong, W.-F.;Guo, J.
    關鍵詞: Spectroscopy;X-rays;Chemistry;Fabrication
    日期: 2015-09-05
    上傳時間: 2016-08-15
    摘要: Many important energy systems are based on the complexity of material architecture, chemistry and interactions among constituents within. To understand and thus ultimately control the energy applications calls for in-situ/operando characterization tools. Recently, we have developed the in-situ/operando soft X-ray spectroscopic systems for the studies of catalytic and electrochemical reactions, and reveal how to overcome the challenge that soft X-rays cannot easily peek into the high-pressure catalytic or liquid electrochemical reactions. The unique design of in-situ/operando soft X-ray spectroscopy instrumentation and fabrication principle and one example are presented.
    關聯: Proceedings of SPIE - The International Society for Optical Engineering 9560
    DOI: 10.1117/12.2187742
    顯示於類別:[物理學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    In-situ operando soft X-ray spectroscopy characterization of interfacial phenomena in energy materials and devices.pdf741KbAdobe PDF97檢視/開啟
    index.html0KbHTML240檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋