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    題名: Optimal two-variable accelerated degradation test plan for Gamma degradation processes
    作者: Tzong-Ru Tsai, W-Y Sung, YL Lio, S Chang, J-C Lu
    關鍵詞: Monte Carlo methods;gamma distributio;life testing;light emitting diodes;maximum likelihood estimation;reliability
    日期: 2015-12-25
    上傳時間: 2016-04-22 13:47:13 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers
    摘要: An accelerated degradation test (ADT) can be used to assess the reliability of highly reliable products by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a constant-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the total cost, an optimal ADT procedure was established to minimize the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a constant measurement frequency were determined. An algorithm is provided to achieve an optimal ADT plan. An extensive Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation data set of light emitting diodes is presented to illustrate the proposed method.
    關聯: IEEE Transactions on Reliability 65(1), pp.459-468
    DOI: 10.1109/TR.2015.2435774
    顯示於類別:[統計學系暨研究所] 期刊論文

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