English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49633/84879 (58%)
造訪人次 : 7692049      線上人數 : 60
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/106158

    題名: Economic design of the life Test with a warranty policy
    作者: Tzong-Ru Tsai;N Jiang;YL Lio
    關鍵詞: loss function;posterior density function;prior density function;truncated life test
    日期: 2015/03/15
    上傳時間: 2016-04-22 13:22:24 (UTC+8)
    摘要: Considering a warranty policy, an optimal truncated life test procedure is developed for the generalized exponential distribution. A total cost model, which involves the costs of testing, experimental time, lot acceptance or rejection, and the warranty, is adopted to establish the loss function of Bayesian decision method. A proper sample size of life test and an acceptance number of threshold are determined to minimize the expected total cost for lot decision. An example regarding the lifetime quality of integrated circuit products is used to demonstrate the proposed method. Numerical results have shown that the proposed method is beneficial for the reduction of expected total cost.
    關聯: Journal of Industrial and Production Engineering 32(4), pp.225-231
    DOI: 10.1080/21681015.2015.1034199
    顯示於類別:[統計學系暨研究所] 期刊論文


    檔案 描述 大小格式瀏覽次數



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋