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    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/105755


    题名: 製備氧化銦錫薄膜之光學與電學研究
    其它题名: Investigation of optical and electrical properties of Indium-Tin Oxide films
    作者: 王健嘉;Wang, Chien-Chia
    贡献者: 淡江大學機械與機電工程學系碩士班
    林清彬;Lin, Chin-Bin
    关键词: 摻雜;氧化銦錫;;;;Indium Tin Oxide;doping;lithium;calcium;Copper
    日期: 2015
    上传时间: 2016-01-22 15:04:27 (UTC+8)
    摘要: 本研究利用共析出法及溶劑熱法成功製備摻雜鈣、鋰及銅之氧化銦錫粉末,摻雜濃度分別為4at%、6at%及8at%,並探討摻雜元素及含量對粉體之光學及電學性質影響。由XRD繞射分析知摻雜元素不會改變氧化銦錫晶體結構。由全光譜儀分析知,摻雜鈣離子會降低其能隙,呈現出紅移的趨勢;而摻雜鋰離子則會增加能隙,呈現出藍移的趨勢。由霍爾電壓分析知,載子濃度隨摻雜量提升而上升,遷移率則是相反。
    The present study has been successful prepared the Ca, Li and Cu -doped ITO powders by the processes of co-precipitation and solvothermal, and the doping concentration are 4at%, 6at%, and 8at%. The effects of doped-elements and content on the optical and electricity properties of ITO powders were investigated. By XRD diffraction analysis, we know that the doped-elements would not change the crystal structure of indium tin oxide. Doping Ca in ITO powders lowered its band-gap energy, and then the spectrum appeared the trends of red-shifted by UV-Visible-NIR spectrophotometer. The band-gap energy of Li -doped ITO powders tended to increase and then the spectrums appeared the trends of blue-shifted. With the increment of the doping concentration, the carrier concentration increased and the mobility decreased.
    显示于类别:[機械與機電工程學系暨研究所] 學位論文

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